L. Jin, Y. Kitamura, Y. Sano, D. Yamaguchi, E. Kondoh, Y. Mizutani, B. Gelloz, “Simultaneous image stacks collection with continuous rotating-compensator of imaging ellipsometers,” Proc. of SPIE 13704, Optical Technology and Measurement for Industrial Applications Conference 2025, 137040D (2025) https://doi.org/10.1117/12.3072385
K. Dezao, A. Matsudera, Y. Harada, S. Kitajima, S. Kodama, H. Ichihashi, M. Matsukawa, "Stable ultrasound sensing by a bilayer surface plasmon resonance type ultrsound sensor, " Appl. Acoust., Vol. 240, p. 110967 (2025). https://doi.org/10.1016/j.apacoust.2025.110967
L. Jin, Y. Kitamura, E. Kondoh, Y. Mizutani, and B. Gelloz, “FDTD analysis for the minimum measurement field of view required for imaging ellipsometry,” Jpn. J. Appl. Phys. 62(10), 108003 (2025). https://iopscience.iop.org/article/10.35848/1347-4065/adea26
国際学会
2025
Y. Harada, R. Mizuno, M. Ishikawa, M. Matsukawa, D. Koyama, Refractive index change under high-frequency , high-intensity ultrasonic irradiation and its relation to nanobubble density distribution, IEEE International Ultrasonics Symposium 2025, Utrecht, Netherland (2025.9)
R. Mizuno, Z. Wu, Y. Harada, A. Emoto, D. Koyama, Optical Characteristics of an Ultrasonic Tunable Liquid Crystal Neutral Density Filter, IEEE International Ultrasonics Symposium 2025, Utrecht, Netherland (2025.9)
L. jin, Y. Kitamura, E. Kondoh, Y. Mizutani, B. Gelloz, FDTD Analysis for Maximum Film Thickness Measuring with Imaging Ellipsometry, 10th International Conference on Spectroscopic Ellipsometry, Colorado, USA (2025. 6)
L. Jin, Y. Kitamura, Y. Sano, D. Yamaguchi, E. Kondoh, Y. Mizutani, B. Gelloz, “Simultaneous image stacks collection with continuous rotating-compensator of imaging ellipsometers,” Optical Technology and Measurement for Industrial Applications Conference 2025, Yokohama, Japan (2025, 4)
